Product Overview
The High Accelerated Temperature and Humidity stress Test Chamber (HAST Chamber) is an advanced environmental testing system designed to evaluate the long-term reliability of electronic components, semiconductors, and materials under extreme conditions of temperature, humidity, and pressure. The High Accelerated Temperature and Humidity stress Test Chamber works by subjecting test specimens to elevated temperatures (typically 105°C to 135°C), high relative humidity (65% to 100% RH), and positive pressure (gauge pressure 0.02 MPa to 0.392 MPa), creating a highly aggressive environment that rapidly accelerates moisture-related failure mechanisms such as corrosion, delamination, and electrochemical migration. While conventional 85°C/85% RH temperature humidity bias testing requires approximately 1,000 hours to complete, the High Accelerated Temperature and Humidity stress Test Chamber can achieve equivalent stress exposure in just 96 hours-reducing test cycles by more than 70%. This efficiency makes the High Accelerated Temperature and Humidity stress Test Chamber indispensable for semiconductor packaging validation, integrated circuit reliability assessment, automotive electronics qualification (AEC-Q100), and PCB manufacturing quality assurance.
Product Features
The High Accelerated Temperature and Humidity stress Test Chamber incorporates robust engineering and intelligent control systems to deliver accurate, repeatable, and safe reliability testing:
- High-temperature & high-pressure testing capacity – Temperature range from +105°C to +145°C (saturated steam temperature), pressure range from 0.02 MPa to 0.392 MPa gauge, humidity up to 100% RH.
- Dual humidity control modes – Supports both unsaturated (65–95% RH) and saturated (100% RH) humidity control. The unsaturated mode simulates realistic damp heat conditions without surface condensation that could distort failure mechanisms.
- Precise control system – 7-inch color touch screen controller with fuzzy logic PID algorithm. Temperature control accuracy ±0.5°C, temperature uniformity ≤±2.0°C (at 100°C), humidity control accuracy ±3% RH. Supports easy switching between saturated and unsaturated modes.
- Cylindrical pressure vessel construction – Inner cylinder made of SUS304 or SUS316 stainless steel with full-penetration welding. The round workspace maximizes product loading and prevents condensation droplets from dripping onto specimens.
- Comprehensive safety protection – Mechanical and electronic dual over-temperature protection; automatic pressure relief valve with manual emergency release; independent pressure monitoring with over-pressure interlock; door interlock that prevents startup unless properly sealed; dry-burn protection for the humidification system; audible and visual alarms with fault code display.
- Specimen power terminals (bias testing) – Built-in hermetic power-pin system allows applying voltage and signals to specimens during testing. Color-coded terminals support up to 72 or 120 pins for convenient and accurate wiring.
- Data management & connectivity – Real-time monitoring of temperature, humidity, and pressure curves. Data exportable to USB flash drive in Excel format; supports Ethernet, RS-232, and RS-485 communication for remote access and download.
- Rapid temperature rise – Climbing time from ambient to 120°C is approximately 45 minutes.
- Automatic water filling – Automatic filling of humidity water at test start, reducing operator intervention. Low water level detection triggers alarm and automatic shutdown.
Test Standards
The High Accelerated Temperature and Humidity stress Test Chamber is designed to fully comply with a comprehensive range of international and industry-specific reliability testing standards, including:
JEDEC standards – JESD22-A110 (HAST with bias), JESD22-A118 (UHAST without bias), JESD22-A102 (Pressure Cooker Test / PCT), JESD22-A100 (Cyclic temperature and humidity bias life), JESD22-A101 (Steady-state temperature, humidity, and bias life), JESD22-A108 (Temperature, bias, and operating life).
IEC standards – IEC 60068-2-66 (Test Cx: Damp heat, steady-state – unsaturated pressurized vapor), IEC 60749 (Semiconductor devices – Mechanical and climatic test methods).
Automotive standards – AEC-Q100 (Failure mechanism-based stress test qualification for integrated circuits), AEC-Q101 (Stress test qualification for discrete semiconductor devices).
Chinese national standards – GB/T 2423.40 (Environmental testing – Part 2: Test methods – Test Cx: Damp heat, steady-state, unsaturated pressurized vapor).
MIL-STD standards – MIL-STD-883 (Test methods and procedures for microelectronics).
By complying with these globally recognized standards, the High Accelerated Temperature and Humidity stress Test Chamber ensures that test results are accepted across international supply chains and by major semiconductor manufacturers and automotive OEMs.
Technical Parameters
Below are the core technical specifications for the High Accelerated Temperature and Humidity stress Test Chamber (typical models, all dimensions are customizable):
|
Parameter |
Specification |
|
Internal dimensions (Diameter × Depth) |
customizable |
|
External dimensions (W×H×D) |
dependent on internal size |
|
Internal volume |
customizable |
|
Temperature range |
+105°C to +145°C (saturated steam temperature; optional up to +155°C or +162°C) |
|
Temperature fluctuation |
±0.5°C |
|
Temperature uniformity |
≤±2.0°C (at 100°C) |
|
Humidity range |
65% RH ~ 100% RH (unsaturated control available for 65–95% RH) |
|
Humidity control accuracy |
±2.5% ~ ±3% RH |
|
Pressure range (gauge) |
0.02 MPa ~ 0.392 MPa (0.2 kg/cm² ~ 4.0 kg/cm²) |
|
Pressure control accuracy |
±0.2 kg/cm² |
|
Steam temperature rise time |
Ambient to 120°C within approx. 45 minutes |
|
Pressure rise time |
Ambient to 1.00 kg/cm² within approx. 45 minutes |
|
Time range setting |
0 ~ 999 hours/minutes/seconds (free setting) |
|
Controller |
7-inch color touch screen, fuzzy logic PID |
|
Specimen power terminals |
Up to 72 or 120 pins, color-coded |
|
Data interfaces |
Ethernet, RS-232, RS-485, USB Host |
|
Power supply |
AC 220V ±10%, 50/60Hz, single-phase (or AC 380V for larger models) |
|
Construction material |
Inner chamber: SUS304/SUS316 stainless steel with full-penetration welding |
|
Safety features |
Over-temperature protection, over-pressure protection, door interlock, water shortage protection, dry-burn protection, automatic pressure relief |
All dimensions, temperature ranges, pressure capacities, and power pin configurations can be fully customized according to specific sample sizes and test standard requirements.
FAQ
Q1: What is the difference between HAST and conventional Temperature Humidity Bias (THB) testing?
A: HAST reduces testing time from weeks to days by elevating temperature, humidity, and pressure simultaneously. While a conventional 85°C/85% RH THB test may require approximately 1,000 hours, the same failure mechanisms can be reproduced in just 96 hours of HAST testing.
Q2: What types of products are typically tested in a HAST chamber?
A: The High Accelerated Temperature and Humidity stress Test Chamber is primarily used for semiconductors (IC packaging, BGA, QFN, COB), microelectronic components, printed circuit boards (PCBs), automotive electronics requiring AEC-Q100 certification, industrial control devices, photovoltaic modules, magnetic materials, and polymer-based materials.
Q3: What is the difference between saturated and unsaturated humidity control modes?
A: Saturated mode (100% RH) creates maximum water vapor penetration for aggressive testing. Unsaturated mode (65–95% RH) provides a more realistic simulation of actual humid conditions, preventing surface condensation that could otherwise produce false failure indications. The High Accelerated Temperature and Humidity stress Test Chamber supports both modes for maximum testing flexibility.
Q4: How is condensation prevented inside the chamber?
A: The cylindrical pressure vessel is geometrically optimized to prevent condensate droplets from forming on the top and dripping onto specimens. Proper chamber design ensures that any condensation runs down the side walls rather than falling onto test samples.
Q5: What are the installation requirements?
A: The chamber should be installed on a level, well-ventilated floor. Power supply must be dedicated with appropriate circuit breaker. A clean water source (tap water or deionized water) with minimum 0.2 MPa pressure is required. Adequate space should be maintained around the unit for ventilation and maintenance access.
Why Choose ALP?
ALP TECHNOLOGY (T&M) LTD is a joint-stock enterprise specializing in environmental testing instrumentation. Guided by "Technological Excellence Rooted in Integrity," ALP serves the lithium battery industry, aerospace, defense, energy, telecommunications, automotive, and research sectors. With clients in over 50 countries across five continents – including government labs, leading lithium battery manufacturers, and Fortune 500 companies – ALP delivers one-stop solutions from temperature chambers and thermal shock testers to salt spray, UV, sand/dust, rain test chambers, and explosion-proof walk-in chambers. Our greatest strength is customization: we design, produce, install, and maintain according to your specific requirements.
Ready to buy ? contact with ALP
Email: info@alp-environment.com
24-Hour Hotline: +86-18092160430
Website: www.alp-environment.com
Technical support: 1-hour response for inquiries, Spare parts available with worldwide shipping.
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